- Add new CP and CR devices
- COC: Zero delay from SIO to INIT state Detect and UEN on 0xFF order
- COC: Moved SIO int pending test to devices
- DK: Zero delay from SIO to INIT state
- DP: Added case points for RDEES, dp_aio_status
- DP: Zero delay from SIO to INIT state
- defs: Added chaining modifier flag
- defs: Fixed DVT_NODEV definition
- defs: Added chan_chk_dvi definition
- io: Added chaining modifier flag
- LP: Zero delay from SIO to INIT state
- LP: Added INIT test for illegal command
- LP: Moved SIO interrupt test to devices
- MT: Zero delay from SIO to INIT state
- PT: Zero delay from SIO to INIT state
- PT: Moved SIO interrupt test to devices
- RAD: Zero delay from SIO to INIT state
- RAD: Fixed nx unit test
- RAD: Fixed write protect test
- TT: Zero delay from SIO to INIT state
- TT: Moved SIO int pending test to devices
Discovered while getting standalone System Exerciser to run:
IO: DVT_NOTDEV macro incorrect, Device mapping algorithm creates false
dispatch points.
This mapped Multi Unit Controller and Single Unit Controller to same
device.
DP, DP, MT, RAD: Test for non-existent device returns wrong status.
DP, DK, MT: TIO status should return non-operational for unattached device.
This corrects an error that caused SIO reject when SIO occured before
a pending seek interrupt on a different device.
- Move the interrupt pending test from sigma_io.c into each device.
- Make the sigma_dp.c test a special case that looks for pending
seek interrupts.
These changes facilitate more robust parameter type checking and helps
to identify unexpected coding errors.
Most simulators can now also be compiled with a C++ compiler without
warnings.
Additionally, these changes have also been configured to facilitate easier
backporting of simulator and device simulation modules to run under the
simh v3.9+ SCP framework.
